Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5867034 | Non-destructive method and apparatus for monitoring carrier lifetime of a semiconductor sample during fabrication | Vladimir Sokolov | 1999-02-02 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5867034 | Non-destructive method and apparatus for monitoring carrier lifetime of a semiconductor sample during fabrication | Vladimir Sokolov | 1999-02-02 |