Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12031924 | Measurement arrangement for X-ray radiation for gap-free 1D measurement | Jürgen Fink, Christian Maurer, Lutz Brügemann | 2024-07-09 |
| 11788975 | Measuring arrangement for x-ray radiation having reduced parallax effects | Jürgen Fink, Christian Maurer, Lutz Brügemann | 2023-10-17 |