CL

Chyuan-Ruey LIN

Overall (All Time): #1,773,681 of 4,157,543Top 45%
2
Patents All Time

Issued Patents All Time

Showing 1–2 of 2 patents

Patent #TitleCo-InventorsDate
12055498 Data processing method and system for detection of deterioration of semiconductor process kits Feng Shen, Hung-Chia Su 2024-08-06
11320381 Deterioration detecting system and method for semiconductor process kits Feng Shen, Hung-Chia Su 2022-05-03