CK

Christoph Krafft

LE Leibniz-Institut Fur Photonische Technologien E.V.: 1 patents #7 of 29Top 25%
Overall (All Time): #2,572,054 of 4,157,543Top 65%
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Patent #TitleCo-InventorsDate
11599738 Method for examining distributed objects by segmenting an overview image Iwan W. Schie, Jürgen Popp 2023-03-07