Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8351051 | System and method of measuring irregularity of a glass substrate | Soon-Jong Lee, Byoung-Chan Park, Seong-Jin Choi, Jae Hoon Chung | 2013-01-08 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8351051 | System and method of measuring irregularity of a glass substrate | Soon-Jong Lee, Byoung-Chan Park, Seong-Jin Choi, Jae Hoon Chung | 2013-01-08 |