Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5514953 | Wafer level test structure for detecting multiple domains and magnetic instability in a permanent magnet stabilized MR head | Allan E. Schultz, Peter K. George, William P. Wood, Patrick J. Ryan | 1996-05-07 |