Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11768224 | Test and burn-in apparatus that provides variable thermal resistance | Jesse Killion | 2023-09-26 |
| 11719743 | Method and apparatus for conducting burn-in testing of semiconductor devices | Jesse Killion | 2023-08-08 |
| 11061069 | Burn-in test apparatus for semiconductor devices | Jesse Killion | 2021-07-13 |
| 7151388 | Method for testing semiconductor devices and an apparatus therefor | Ching Teong, Samuel Lim | 2006-12-19 |