Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7149279 | Detecting unit for X-ray diffraction measurements | Muradin Abubekirovich Kumakhov, Nariman S. Ibraimov, Ekaterina V. Likhushina, Alexander E. Bulkin, Svetlana V. Nikitina | 2006-12-12 |
| 7116753 | Method for determination of elastic strains present in single-crystal wafers and device for its realization | Muradin Abubekirovich Kumakhov, Nariman S. Ibraimov, Svetlana V. Nikitina, Alexander V. Kotelkin, Alexander D. Zvonkov | 2006-10-03 |