Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5748640 | Technique for incorporating a built-in self-test (BIST) of a DRAM block with existing functional test vectors for a microprocessor | Chongjun Jiang, David A. Spilo, Timothy J. Baldwin, Bobby I. Pinkerton, Jr. | 1998-05-05 |