MF

Marc Fouchier

IV Interuniversitair Micro-Electronica Centrum Vzw: 2 patents #79 of 450Top 20%
AT AT&T: 1 patents #10,626 of 18,772Top 60%
IM Imec: 1 patents #297 of 687Top 45%
Overall (All Time): #1,133,864 of 4,157,543Top 30%
4
Patents All Time

Issued Patents All Time

Showing 1–4 of 4 patents

Patent #TitleCo-InventorsDate
11782001 Dislocation type and density discrimination in semiconductor materials using cathodoluminescence measurements Christian Monachon 2023-10-10
8079093 Dual tip atomic force microscopy probe and method for producing such a probe 2011-12-13
7500387 Dual tip atomic force microscopy probe and method for producing such a probe 2009-03-10
7240428 Method for making probes for atomic force microscopy 2007-07-10