Issued Patents All Time
Showing 1–9 of 9 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10082535 | Programmable test structure for characterization of integrated circuit fabrication processes | Esko Mikkola | 2018-09-25 |
| 7315180 | Device for monitoring quiescent current of an electronic device | Stefaan Kerckenaere, Bohumil Straka | 2008-01-01 |
| 7315974 | Method for detecting faults in electronic devices, based on quiescent current measurements | Piet De Pauw | 2008-01-01 |
| 6927592 | Device for monitoring quiescent current of an electronic device | Stefaan Kerckenaere, Bohumil Straka | 2005-08-09 |
| 6859058 | Method and apparatus for testing electronic devices | Stopjakova Viera | 2005-02-22 |
| 6531885 | Method and apparatus for testing supply connections | Stefaan Kerckenaere | 2003-03-11 |
| 6496028 | Method and apparatus for testing electronic devices | Stopjakova Viera | 2002-12-17 |
| 6441633 | High resolution (quiescent) supply current system (IDD monitor) | Stefaan Kerckenaere, Viera Stopjakova | 2002-08-27 |
| 6118293 | High resolution (quiescent) supply current system (IDD monitor) | Stefaan Kerckenaere, Viera Stopjakova | 2000-09-12 |