Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9714907 | Method and apparatus for measuring scattering intensity distribution | Tadashi Matsushita, Wolfgang Voegeli, Tetsuro Shirasawa, Toshio Takahashi | 2017-07-25 |
| 8036338 | Method and device for simultaneous measurement of magnetostriction and magnetization | Noriyuki Aizawa, Koichi Maruyama | 2011-10-11 |