Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12307747 | In-situ detection of anomalies in integrated circuits using machine learning models | Sriram R. Vangal, Vivek K. De, Narayan Srinivasa, Farzin Guilak, Miguel Bautista Gabriel +1 more | 2025-05-20 |