Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6778450 | Programmable weak write test mode | Eric B. Selvin, Ali R. Farhang | 2004-08-17 |
| 6374377 | Low yield analysis of embedded memory | Glenn F. King, Tim Lambert | 2002-04-16 |
| 6366990 | Method and apparatus for software controlled timing of embedded memory | Glenn F. King, Tim Lambert, Navin SAXENA, Peter J. DesRosier | 2002-04-02 |
| 6185703 | Method and apparatus for direct access test of embedded memory | James M. Cleary, Tsafrir Israeli | 2001-02-06 |
| 5031141 | Apparatus for generating self-timing for on-chip cache | Paul D. Madland | 1991-07-09 |