Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10938620 | Configuration of a programmable device | Eng Ling Ho, Sean R. Atsatt, Chiew Siang Wong, Rob Pelt, Ee Mei Ooi | 2021-03-02 |
| 10355909 | Configuration of a programmable device | Eng Ling Ho, Sean R. Atsatt, Chiew Siang Wong, Rob Pelt, Ee Mei Ooi | 2019-07-16 |
| 9098486 | Methods and apparatus for testing multiple clock domain memories | Tze Sin Tan | 2015-08-04 |
| 7984344 | Techniques for testing memory circuits | Tze Sin Tan, Ala-Uddin Ismail, Siew Ling Yeoh | 2011-07-19 |
| 7949916 | Scan chain circuitry for delay fault testing of logic circuits | — | 2011-05-24 |
| 7761754 | Techniques for testing memory circuits | Tze Sin Tan, Ala-Uddin Ismail, Siew Ling Yeoh | 2010-07-20 |