Issued Patents All Time
Showing 26–26 of 26 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5329533 | Partial-scan built-in self-test technique | — | 1994-07-12 |
CL
Chih-Jen Lin
Intel: 6 patents #6,151 of 30,777Top 20%
AT&T: 3 patents #5,550 of 18,772Top 30%
United Microelectronics: 2 patents #1,942 of 4,560Top 45%
Unknown: 1 patents #29,356 of 83,584Top 40%
National Chung Cheng University: 1 patents #164 of 580Top 30%
Agere Systems: 1 patents #984 of 1,849Top 55%
Overall (All Time): #154,186 of 4,157,543Top 4%
26
Patents All Time