Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9874607 | Method and apparatus for using programmable logic circuitry to test on-chip analog-to-digital converter | Chee Lam Ng, Tze Sin Tan, Nen Wei Ng | 2018-01-23 |
| 8327199 | Integrated circuit with configurable test pins | Jayabrata Ghosh Dastidar, Siew Ling Yeoh, Jun Tan, Kok Sun Chia, Yee Liang Tan +1 more | 2012-12-04 |