Patent Leaderboard
USPTO Patent Rankings Data through Dec 31, 2025
BK

Beverly Klemme — 8 Patents

Intel: 4 patents #8,538 of 30,777Top 30%
FAFalkonry: 2 patents #7 of 16Top 45%
BCBoxer Cross: 1 patents #5 of 5Top 100%
Applied Materials: 1 patents #4,824 of 7,310Top 70%
San Jose, CA: #7,707 of 32,062 inventorsTop 25%
California: #74,834 of 386,348 inventorsTop 20%
Overall (All Time): #600,572 of 4,157,543Top 15%
8 Patents All Time
Beverly Klemme has been granted 8 US patents while listed as an inventor at Intel. The first was granted in 2004 and the most recent in February 2025. Beverly Klemme ranks #600,572 of 4,157,543 US inventors in our database (top 14.4%). Patent records list Beverly Klemme in San Jose, CA, US.

Patents per Year

Patents granted per year, 2004 to 2025Bar chart with a peak of 2 patents in 2022.peak 22004: 1 patents20042006: 1 patents20062019: 1 patents20192020: 1 patents20202022: 2 patents20222023: 1 patents20232025: 1 patents2025

Issued Patents All Time

Showing 1–8 of 8 patents

Patent #TitleCo-InventorsDateApprox Value ⓘ
12228922 Computing an explainable event horizon estimate Peter Nicholas Pritchard, Daniel Kearns, Nikunj R. Mehta, Deeksha Karanjgaokar 2025-02-18
11849280 Apparatus and methods for bone conduction context detection Rajashree Baskaran, Sergio E. Sian 2023-12-19 $50,836,000
11480956 Computing an explainable event horizon estimate Peter Nicholas Pritchard, Daniel Kearns, Nikunj R. Mehta, Deeksha Karanjgaokar 2022-10-25
11356772 Apparatus and methods for bone conduction context detection Rajashree Baskaran, Sergio E. Sian 2022-06-07 $12,864,000
10827261 Apparatus and methods for bone conduction context detection Rajashree Baskaran, Sergio E. Sian 2020-11-03 $38,832,000
10455324 Apparatus and methods for bone conduction context detection Rajashree Baskaran, Sergio E. Sian 2019-10-22 $16,310,000
7130055 Use of coefficient of a power curve to evaluate a semiconductor wafer Peter G. Borden, Regina G. Nijmeijer 2006-10-31 $22,898,000
6812717 Use of a coefficient of a power curve to evaluate a semiconductor wafer Peter G. Borden, Regina G. Nijmeijer 2004-11-02