Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7705620 | Measuring and identifying analog characteristics of a microelectronic component at a wafer level and a platform level | Mukul Kelkar, Jonathan Kenton, Iris Wong | 2010-04-27 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7705620 | Measuring and identifying analog characteristics of a microelectronic component at a wafer level and a platform level | Mukul Kelkar, Jonathan Kenton, Iris Wong | 2010-04-27 |