Issued Patents All Time
Showing 1–3 of 3 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9373417 | Circuit and method for testing memory devices | — | 2016-06-21 |
| 9287008 | Circuit and method for controlling internal test mode entry of an ASRAM chip | — | 2016-03-15 |
| 9171609 | Address transition detecting circuit | Seong Jun Jang | 2015-10-27 |