Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9222916 | Through-coil arrangement, test apparatus with through-coil arrangement and testing method | Matthias Boecker, Stefan Koch | 2015-12-29 |
| 5184070 | Eddy-current defect test instrument with multiple test probes and one distance probe | Herman Besendorfer, Gunter Stritzke | 1993-02-02 |