Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6434725 | Method and system for semiconductor testing using yield correlation between global and class parameters | Michael Sommer, Herbert Lammering | 2002-08-13 |
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6434725 | Method and system for semiconductor testing using yield correlation between global and class parameters | Michael Sommer, Herbert Lammering | 2002-08-13 |