Issued Patents All Time
Showing 1–17 of 17 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11556097 | Neural network circuitry for motors with first plurality of neurons and second plurality of neurons | Frederik Funk, Syed Naveed Abbas Rizvi, Rainer Menes | 2023-01-17 |
| 11456646 | Neural network circuitry for motors | Frederik Funk, Rainer Menes, Syed Naveed Abbas Rizvi | 2022-09-27 |
| 10438680 | Non-volatile memory testing | — | 2019-10-08 |
| 7715257 | Test method and semiconductor device | — | 2010-05-11 |
| 7421629 | Semi-conductor component test device, in particular data buffer component with semi-conductor component test device, as well as semi-conductor component test procedure | Martin Meier | 2008-09-02 |
| 7415649 | Semi-conductor component test device with shift register, and semi-conductor component test procedure | — | 2008-08-19 |
| 7375508 | Device and a process for the calibration of a semiconductor component test system | — | 2008-05-20 |
| 7330378 | Inputting and outputting operating parameters for an integrated semiconductor memory device | Martin Perner | 2008-02-12 |
| 7323861 | Contact plate for use in standardizing tester channels of a tester system and a standardization system having such a contact plate | — | 2008-01-29 |
| 7317323 | Signal test procedure for testing semi-conductor components and a test apparatus for testing semi-conductor components | — | 2008-01-08 |
| 7184339 | Semi-conductor component, as well as a process for the in-or output of test data | Martin Perner, Volker Kilian, Martin Meier | 2007-02-27 |
| 7180313 | Test device for wafer testing digital semiconductor circuits | — | 2007-02-20 |
| 7061227 | Apparatus and method for calibrating a semiconductor test system | Arti Prasad Roth | 2006-06-13 |
| 7061260 | Calibration device for the calibration of a tester channel of a tester device and a test system | Gerd Frankowsky, Gerd Brösamlen | 2006-06-13 |
| 6898739 | Method and device for testing a memory circuit | Ralf Schneider | 2005-05-24 |
| 6754869 | Method and device for testing set-up time and hold time of signals of a circuit with clocked data transfer | Ralf Schneider | 2004-06-22 |
| 6750670 | Integrated test circuit | Ralf Schneider | 2004-06-15 |