Issued Patents All Time
Showing 1–4 of 4 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7372072 | Semiconductor wafer with test structure | Ramona Winter, Valentin Rosskopf, Sibina Sukman-Praehofer | 2008-05-13 |
| 7205567 | Semiconductor product having a semiconductor substrate and a test structure and method | Andreas Felber, Valentin Rosskopf, Sibina Sukman-Praehofer | 2007-04-17 |
| 7126154 | Test structure for a single-sided buried strap DRAM memory cell array | Valentine Rosskopf, Sibina Sukman-Prahofer, Andreas Felber | 2006-10-24 |
| 6856562 | Test structure for measuring a junction resistance in a DRAM memory cell array | Valentin Rosskopf, Andreas Felber, Sibina Sukman | 2005-02-15 |