Issued Patents All Time
Showing 1–1 of 1 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10197599 | Test pin configuration for test device for testing devices under test | Fu San Hiew, Wee Kuan Tan, Arieff Ridzwan Yussuff, Murad Hudda, Wang Xiaojun +5 more | 2019-02-05 |