Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7539911 | Test mode for programming rate and precharge time for DRAM activate-precharge cycle | Robert Perry, Norbert Rehm, Jan Zieleman | 2009-05-26 |
| 7457177 | Random access memory including circuit to compress comparison results | Rob Perry, Norbert Rehm, Jan Zieleman, Dirk Fuhrmann | 2008-11-25 |
| 7362632 | Test parallelism increase by tester controllable switching of chip select groups | Norbert Rehm, Rob Perry, Jan Zieleman, Dirk Fuhrmann | 2008-04-22 |
| 7313033 | Random access memory including first and second voltage sources | Dirk Fuhrmann, Jan Zieleman, Norbert Rehm, Rob Perry | 2007-12-25 |
| 7299388 | Method and apparatus for selectively accessing and configuring individual chips of a semi-conductor wafer | Jan Zieleman, Robert Perry, Norbert Rehm, Dirk Fuhrmann | 2007-11-20 |