Issued Patents All Time
Showing 1–14 of 14 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10756081 | Avalanche diode having an enhanced defect concentration level and method of making the same | Jens Schneider, Kai Esmark | 2020-08-25 |
| 9812438 | Avalanche diode having an enhanced defect concentration level and method of making the same | Jens Schneider, Kai Esmark | 2017-11-07 |
| 9257523 | Avalanche diode having an enhanced defect concentration level and method of making the same | Jens Schneider, Kai Esmark | 2016-02-09 |
| 8791547 | Avalanche diode having an enhanced defect concentration level and method of making the same | Jens Schneider, Kai Esmark | 2014-07-29 |
| 8710590 | Electronic component and a system and method for producing an electronic component | Philipp Riess, Henning Feick | 2014-04-29 |
| 8043934 | Methods of use and formation of a lateral bipolar transistor with counter-doped implant regions under collector and/or emitter regions | Jens Schneider | 2011-10-25 |
| 7875933 | Lateral bipolar transistor with additional ESD implant | Jens Schneider | 2011-01-25 |
| 7709896 | ESD protection device and method | Cornelius Christian Russ, David Alvarez, Kiran V. Chatty, Jens Schneider, Robert J. Gauthier, JR. | 2010-05-04 |
| 7359169 | Circuit for protecting integrated circuits against electrostatic discharges | Kai Esmark, Harald Gossner, Wolfgang Stadler, Martin Streibl | 2008-04-15 |
| 7087938 | ESD protective circuit with collector-current-controlled triggering for a monolithically integrated circuit | Martin Streibl, Kai Esmark, Christian Russ, Harald Gossner | 2006-08-08 |
| 7009404 | Method and device for testing the ESD resistance of a semiconductor component | Richard Owen, Harald Gossner, Wolfgang Stadler, Philipp Riess, Martin Streibl +1 more | 2006-03-07 |
| 6930501 | Method for determining an ESD/latch-up strength of an integrated circuit | Silke Bargstadt-Franke, Kai Esmark, Harald Gossner, Philipp Riess, Wolfgang Stadler +1 more | 2005-08-16 |
| 6905892 | Operating method for a semiconductor component | Kai Esmark, Harald Gossner, Philipp Riess, Wolfgang Stadler, Martin Streibl | 2005-06-14 |
| 6559503 | Transistor with ESD protection | Xaver Guggenmos, Wolfgang Stadler | 2003-05-06 |