Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10580656 | Method of reducing trench depth variation from reactive ion etching process | Daniel Tutuc, Andrew Christopher Graeme Wood | 2020-03-03 |
| 10132765 | Method and apparatus for determining lattice parameters of a strained III-V semiconductor layer | — | 2018-11-20 |