Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 11579280 | Phase, phase noise, and slave mode measurement for millimeter wave integrated circuits on automatic test equipment | Hao Li | 2023-02-14 |
| 10673545 | Noise measurement for integrated circuit device with on-device test signal up-conversion | Thomas OBERMUELLER | 2020-06-02 |