Issued Patents All Time
Showing 1–5 of 5 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9793220 | Detection of environmental conditions in a semiconductor chip | Hans-Joachim Barth, Peter Baumgartner, Philipp Riess, Jesenka Veledar Krueger | 2017-10-17 |
| 7973547 | Method and apparatus for detecting a crack in a semiconductor wafer, and a wafer chuck | Alois Nitsch, Rainer Tilgner | 2011-07-05 |
| 6794209 | Method for the in-situ fabrication of DFB lasers | Roland Gessner, Eberhard Veuhoff, Gundolf Wenger | 2004-09-21 |
| 6699778 | Masking method for producing semiconductor components, particularly a BH laser diode | Bernd Borchert, Roland Gessner, Eberhard Veuhoff, Gundolf Wenger | 2004-03-02 |
| 6599843 | In-situ mask technique for producing III-V semiconductor components | Roland Gessner, Eberhard Veuhoff, Gundolf Wenger | 2003-07-29 |