Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 6107815 | Test circuit and testing method for function testing of electronic circuits | Wolfgang Nikutta, Hartmut Schmökel, Thomas von der Ropp, Rudolph Walter | 2000-08-22 |
| 4752929 | Method of operating a semiconductor memory with a capability of testing, and an evaluation circuit for performing the method | Dieter Kantz | 1988-06-21 |