CL

Chaun Lin

Infineon Technologies Ag: 1 patents #4,439 of 7,486Top 60%
📍 Poughquag, NY: #72 of 99 inventorsTop 75%
🗺 New York: #67,335 of 115,490 inventorsTop 60%
Overall (All Time): #3,519,341 of 4,157,543Top 85%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6602729 Pulse voltage breakdown (VBD) technique for inline gate oxide reliability monitoring 2003-08-05