Issued Patents All Time
Showing 1–6 of 6 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9562763 | Apparatus for inspecting curvature | — | 2017-02-07 |
| 9482624 | Apparatus for inspecting | — | 2016-11-01 |
| 8009298 | Method and apparatus for acquiring reference grating of three-dimensional measurement system using moire | Yu-Hyun Moon | 2011-08-30 |
| 7859683 | Fast three-dimensional shape measuring apparatus and method | Young Chul KWON | 2010-12-28 |
| 6459092 | 6 degree-of-freedom (DOF) motion measuring apparatus | Hyung Suck Cho, Won Shik Park, Noh Yeol Park, Yong-kyu Byun | 2002-10-01 |
| 6222903 | Laminography system having a view selector with prism | Hyeong Cheol Kim, Jong Eun Byun, Jin Young Kim, Chang-hyo Kim, Hyung-Seok Cho +1 more | 2001-04-24 |