Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10311964 | Memory control circuit and memory test method | Jenn-Shiang Lai, Chih-Yen Lo, Jin-Fu Li | 2019-06-04 |
| 9588717 | Fault-tolerance through silicon via interface and controlling method thereof | Chih-Yen Lo, Ding-Ming Kwai, Chi-Chun Yang, Yun-Chao Yu, Jin-Fu Li | 2017-03-07 |