Issued Patents All Time
Showing 1–10 of 10 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8717677 | Optical device and optical filter | Yu-Shan Chang, Hau-Wei Wang | 2014-05-06 |
| 8223335 | System for alignment measurement for rolling embossed double-sided optical film and method thereof | Shu-Ping Dong, Hung-Ming Tai | 2012-07-17 |
| 8154725 | Line scanning measurement system | — | 2012-04-10 |
| 8130378 | Phase retardance inspection instrument | Chun-I Wu, Kai-Ping Chuang, Wan-Yi Lin, Yi-Chen Hsieh | 2012-03-06 |
| 8059282 | Reflective film thickness measurement method | — | 2011-11-15 |
| 7869034 | Multi-angle and multi-channel inspecting device | Hau-Wei Wang, Yu-Shan Chang | 2011-01-11 |
| 7495762 | High-density channels detecting device | Hau-Wei Wang, Ding-Hsiang Pan | 2009-02-24 |
| 7450230 | Multi-channel imaging spectrometer | Kai-Ping Chuang, Hau-Wei Wang | 2008-11-11 |
| 7414718 | Apparatus for measuring spectrographic images | Hau-Wei Wang | 2008-08-19 |
| 7167322 | Beam shaping apparatus | Jyh-Long Chern, Chia-Yu Liu, Hau-Wei Wang | 2007-01-23 |