Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 4690552 | Optical method and apparatus for strain analysis | Ralph M. Grant, Anthony Paskus, Stanley R. Windeler, Forrest S. Wright | 1987-09-01 |
| 4620223 | Interferometric deformation analysis system | Yau Y. Hung | 1986-10-28 |