Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9733366 | System and method for characterizing focused charged beams | Samit Paul | 2017-08-15 |
| 9576767 | Focused ion beam systems and methods of operation | Jose Mathew | 2017-02-21 |