SM

Shyam Mohan

IK Indian Institute Of Technology Kanpur: 1 patents #23 of 61Top 40%
Overall (All Time): #2,967,522 of 4,157,543Top 75%
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Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
9778202 Systems and methods for imaging characteristics of a sample and for identifying regions of damage in the sample Satyajit Banerjee, Jaivardhan Sinha 2017-10-03