Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9709598 | Scanning ion conductance microscopy using surface roughness for probe movement | Pavel Novak, Chao Li, Andrew Shevchuk, Victor Petrovich Ostanin, David Klenerman +2 more | 2017-07-18 |
| 9354249 | Scanning ion conductance microscopy using piezo actuators of different response times | Pavel Novak, Chao Li, Andrew Shevchuk, Victor Petrovich Ostanin, David Klenerman +2 more | 2016-05-31 |