Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 8103463 | Systems and methods for predicting failure of electronic systems and assessing level of degradation and remaining useful life | Patrick W. Kalgren, Antonio Ginart, Sashank Nanduri, Anthony J. Boodhansingh, Carl Byington +4 more | 2012-01-24 |