Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9411000 | Method and system for measuring capacitance difference between capacitive elements | Geert Van der Plas, Ken Sawada, Yuichi Miyamori, Ankur Anchlia | 2016-08-09 |
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9411000 | Method and system for measuring capacitance difference between capacitive elements | Geert Van der Plas, Ken Sawada, Yuichi Miyamori, Ankur Anchlia | 2016-08-09 |