PM

Pawel Malinowski

IV Imec Vzw: 2 patents #272 of 1,046Top 30%
3M: 1 patents #7,233 of 11,543Top 65%
FU Fujifilm: 1 patents #3,076 of 4,519Top 70%
IM Imec: 1 patents #297 of 687Top 45%
KR Katholieke Universiteit Leuven, Ku Leuven R&D: 1 patents #173 of 512Top 35%
NE Netapp: 1 patents #1,159 of 1,846Top 65%
📍 Heverlee, WA: #1 of 2 inventorsTop 50%
Overall (All Time): #782,932 of 4,157,543Top 20%
6
Patents All Time

Issued Patents All Time

Showing 1–6 of 6 patents

Patent #TitleCo-InventorsDate
12324301 Contaminated interface mitigation in a semiconductor device Tung Huei Ke, David Cheyns 2025-06-03
10862036 Method for high resolution patterning of organic layers Tung Huei Ke, Atsushi Nakamura 2020-12-08
10533118 Roll of an adhesive tape having an adhesive layer comprising a structural adhesive and its method of manufacture Tomasz P. Wikierak, Marcin J. Paprocki, Elisabeth Cura 2020-01-14
10096776 Method for lithographic patterning of organic layers Atsushi Nakamura, Yu Iwai 2018-10-09
8835986 Method for fabrication of III-nitride device and the III-nitride device thereof Puneet Srivastava, Marleen Van Hove 2014-09-16
8032725 Backup data management on a fractionally reserved storage system Michael David Mankovsky 2011-10-04