Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 7308157 | Method and apparatus for optical inspection of a display | Reza Safaee-Rad, Aleksander Crnatovic, Jeffrey Hawthorne, Ray Leerentveld | 2007-12-11 |
| 6252626 | Test and alignment system for electronic display devices | Eric S. Buckley, Bruce Lee, Wayne Dawe, Andrew Gerard Noonan, Todd Richardson | 2001-06-26 |
| 6058221 | Electron beam profile measurement method and system | Reza Safaee-Rad, Karoly Nemeth | 2000-05-02 |
| 5969756 | Test and alignment system for electronic display devices and test fixture for same | Eric S. Buckley, Wayne Dawe, Paul Farrer, Karoly Nemeth, Andrew Gerard Noonan | 1999-10-19 |