Issued Patents All Time
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 12422254 | Thickness measurement device and thickness measurement method | Seiichi Ohmori, Tomohiko Shiota | 2025-09-23 |
| 12105050 | Damage evaluation device and damage evaluation method | Yuuki Nagai, Hiroaki Hatanaka | 2024-10-01 |