Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 10345375 | Test method and test apparatus for testing a plurality of blocks in a circuit | Fei DONG, Shu Gong, Hai Long Li, Liu Di Wang | 2019-07-09 |
| 9664741 | Test method and test apparatus for testing a plurality of blocks in a circuit | Fei DONG, Shu Gong, Hai Long Li, Liu Di Wang | 2017-05-30 |