Issued Patents All Time
Showing 1–2 of 2 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 9784762 | Determination of local contact potential difference by noncontact atomic force microscopy | Leo Gross, Gerhard Meyer, Bruno Schuler | 2017-10-10 |
| 9316668 | Determination of local contact potential difference by noncontact atomic force microscopy | Leo Gross, Gerhard Meyer, Bruno Schuler | 2016-04-19 |