WC

William R. Case

IBM: 1 patents #44,794 of 70,183Top 65%
📍 Walden, NY: #31 of 49 inventorsTop 65%
🗺 New York: #67,335 of 115,490 inventorsTop 60%
Overall (All Time): #4,025,351 of 4,157,543Top 100%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
4555767 Method and apparatus for measuring thickness of epitaxial layer by infrared reflectance Wildey E. Johnson 1985-11-26