WD

William I. Doxsey

IBM: 1 patents #44,794 of 70,183Top 65%
Overall (All Time): #3,798,779 of 4,157,543Top 95%
1
Patents All Time

Issued Patents All Time

Patent #TitleCo-InventorsDate
5317338 Visual measurement technique and test pattern for aperture offsets in photoplotters John J. Masten, Jr., deceased, Richard M. Schroedl, Donald G. Will 1994-05-31