Issued Patents All Time
Showing 26–27 of 27 patents
| Patent # | Title | Co-Inventors | Date |
|---|---|---|---|
| 5216362 | Contactless technique for measuring epitaxial dopant concentration profiles in semiconductor wafers | — | 1993-06-01 |
| 4812756 | Contactless technique for semicondutor wafer testing | Huntington W. Curtis, Min-Su Fung | 1989-03-14 |