PC

Pierre M. Companion

IBM: 1 patents #44,794 of 70,183Top 65%
📍 Winooski, VT: #35 of 57 inventorsTop 65%
🗺 Vermont: #3,027 of 4,968 inventorsTop 65%
Overall (All Time): #3,602,438 of 4,157,543Top 90%
1
Patents All Time

Issued Patents All Time

Showing 1–1 of 1 patents

Patent #TitleCo-InventorsDate
6330354 Method of analyzing visual inspection image data to find defects on a device Karl K. Moody, III, Brenda M. Wilson 2001-12-11